Phase-shifting projection moiré for out-of-plane displacement measurement

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 4317, Issue , 2001, Pages 170-179

  Jeong, M S ^a   Kim, S W ^a  

^a Korea Advanced Institute of Science and Technology (KAIST)   (South Korea)

Author keywords

2 ambiguity; Dual frequency mode; Human 3 D measurement; Non contact 3 D measurement; Out of plane displacement measurement; Phase shifting fringe analysis; Phase shifting projection moir ; Systematic error analysis

Indexed keywords

ALGORITHMS; CHARGE COUPLED DEVICES; DEFLECTION (STRUCTURES); ERROR ANALYSIS; INTERFEROMETRY; VIBRATIONS (MECHANICAL);

PHASE SHIFTING FRINGE ANALYSIS;

MECHANICAL VARIABLES MEASUREMENT;

EID: 0034876514     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.429566     Document Type: Conference Paper

References (11)

1. Overview of three-dimensional shape measurement using optical methods
2. Moiré topography
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4. Use of phase-stepping automatic fringe analysis in moiré interferometry
5. Shadow moiré topography by means of phase-shift method
6. Phase-shifting grating projection moiré topography
7. Two-wavelength phase shifting interferometry
8. Temporal phase-unwrapping algorithm for automated interferogram analysis
9. Design of algorithms for phase measurements by the use of phase stepping
10. Phase shifting for non-sinusoidal waveforms with phase-shift errors
11. Phase-shifting interferometry