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Volumn 23, Issue 4, 2001, Pages 232-234
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Sectional voltage contrast topography of quantum well diodes
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Author keywords
Differential voltage contrast; Fermi energies; Quantum well lasers; Scanning electron microscopy sectional topography
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Indexed keywords
CALIBRATION;
FERMI LEVEL;
LIGHT EMISSION;
QUANTUM WELL LASERS;
SCANNING ELECTRON MICROSCOPY;
SEMICONDUCTING GALLIUM ARSENIDE;
VOLTAGE MEASUREMENT;
DIFFERENTIAL VOLTAGE CONTRAST (DVC) METHOD;
QUASI-FERMI ENERGY (QFE);
SEMICONDUCTOR DIODES;
ARTICLE;
CONTRAST;
ELECTRON MICROSCOPY;
ENERGY;
IMAGE ANALYSIS;
LASER;
LIGHT EMITTING DIODE;
PRIORITY JOURNAL;
SCANNING ELECTRON MICROSCOPY;
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EID: 0034876319
PISSN: 01610457
EISSN: None
Source Type: Journal
DOI: 10.1002/sca.4950230402 Document Type: Article |
Times cited : (1)
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References (3)
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