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Volumn 23, Issue 4, 2001, Pages 232-234

Sectional voltage contrast topography of quantum well diodes

Author keywords

Differential voltage contrast; Fermi energies; Quantum well lasers; Scanning electron microscopy sectional topography

Indexed keywords

CALIBRATION; FERMI LEVEL; LIGHT EMISSION; QUANTUM WELL LASERS; SCANNING ELECTRON MICROSCOPY; SEMICONDUCTING GALLIUM ARSENIDE; VOLTAGE MEASUREMENT;

EID: 0034876319     PISSN: 01610457     EISSN: None     Source Type: Journal    
DOI: 10.1002/sca.4950230402     Document Type: Article
Times cited : (1)

References (3)
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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.