Fast imaging of a 41cm amorphous silicon flat-panel detector for radiographic applications

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 4320, Issue , 2001, Pages 87-93

  Kump, K S ^a  

^a GE HEALTHCARE   (United States)

Author keywords

Amorphous silicon x ray detector dynamic imaging dual energy DQE lag

Indexed keywords

AMORPHOUS SILICON; IMAGE QUALITY; MEDICAL IMAGING; PHOSPHORS; RADIOGRAPHY;

AMORPHOUS SILICON FLAT-PANEL DETECTOR; RADIOGRAPHIC APPLICATIONS;

DETECTORS;

EID: 0034873663     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.430888     Document Type: Conference Paper

References (8)

1. Performance characteristics of an amorphous silicon flat panel x-ray imaging detector
2. 2 amorphous silicon flat panel x-ray detector for radiographic imaging applications
3. DQE(f) of an amorphous silicon flat panel x-ray detector: Detector parameter influences and measurement methodology
4. Clinical comparison of a new digital x-ray detector system with a conventional screen film system
5. Investigation of basic imaging properties in digital radiography. 13 effect on simple structured noise on the detectability of simulated stenotic lesions
6. Comparison of receiver operating characteristic and forced choice observer performance measurement methods
7. An adaptive reference/test paradigm: Application to pulsed fluoroscopy perception
8. Comparison of low contrast detectability between a digital amorphous silicon and a screen-film based imaging system for thoracic radiography