Measurement of the noise power spectrum in digital x-ray detectors

Proceedings of SPIE- The International Society for Optical Engineering

Volumn 4320, Issue , 2001, Pages 362-372

  Aufrichtig, R ^a   Su, Y ^a   Cheng, Y ^a   Granfors, P R ^a  

^a GENERAL ELECTRIC COMPANY   (United States)

Author keywords

Amorphous silicon; Digital x ray radiography; Flat panel detector; Noise power spectrum

Indexed keywords

FLAT PANEL DISPLAYS; FOURIER TRANSFORMS; IMAGE ANALYSIS; ONE DIMENSIONAL; PATTERN RECOGNITION; QUANTUM OPTICS; SPECTRUM ANALYSIS; SPURIOUS SIGNAL NOISE; TWO DIMENSIONAL; X RAY ANALYSIS; X RAY APPARATUS;

DETECTIVE QUANTUM EFFICIENCY; DIGITAL X RAY DETECTORS; HAMMING WINDOWS; NOISE POWER SPECTRUM;

MEDICAL IMAGING;

EID: 0034867061     PISSN: 0277786X     EISSN: None     Source Type: Journal    
DOI: 10.1117/12.430934     Document Type: Article

References (8)

1. Imaging performance of a digital storage phosphor system
2. Image quality of a digital chest radiography system based on a selenium detector
3. DQE(f) of four generations of computed radiography acquisition devices
4. A comprehensive physical image quality evaluation of a selenium based digital x-ray imaging system for thorax radiography
5. 2 amorphous silicon flat panel x-ray detector for radiographic imaging applications
6. The use of fast Fourier transform for the estimation of power spectra: A method based on time averaging over short, modified periodograms