Reliability of polysilicon thin film transistors on stainless steel foil substrates

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 4295, Issue , 2001, Pages 108-110

  Afentakis, T ^a   Hatalis, M ^a  

^a LEHIGH UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

COST EFFECTIVENESS; ELECTROLYTIC POLISHING; METAL FOIL; POLYSILICON; RELIABILITY THEORY; SILICON WAFERS; STAINLESS STEEL; SUBSTRATES;

STAINLESS STEEL FOIL SUBSTRATES;

THIN FILM TRANSISTORS;

EID: 0034858828     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.424863     Document Type: Conference Paper

References (3)

1. Polysilicon thin film transistors on steel substrates
2. Polysilicon TFT display driver circuits on stainless steel foil substrates