메뉴 건너뛰기




Volumn 15, Issue 1-2, 2001, Pages 283-285

Memory effects in MOS capacitors with silicon quantum dots

Author keywords

Nanocrystal memory; Silicon rich oxide; Single electron memory; SRO

Indexed keywords

ANNEALING; CHEMICAL VAPOR DEPOSITION; HYSTERESIS; SEMICONDUCTOR QUANTUM DOTS; SILICON; SUPERSATURATION; THIN FILMS; TRANSMISSION ELECTRON MICROSCOPY;

EID: 0034851359     PISSN: 09284931     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0928-4931(01)00220-X     Document Type: Article
Times cited : (3)

References (4)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.