|
|
Volumn 80-81, Issue , 2001, Pages 379-384
|
|
Simulation of the backward current in polycrystalline silicon thin-film transistors
a
|
|
Author keywords
Modelling; Polysilicon; TFT
|
|
Indexed keywords
CHEMICAL VAPOR DEPOSITION;
COMPUTER SIMULATION;
CURRENT VOLTAGE CHARACTERISTICS;
ENERGY GAP;
GRAIN BOUNDARIES;
GRAIN SIZE AND SHAPE;
LEAKAGE CURRENTS;
POLYSILICON;
LOW PRESSURE CHEMICAL VAPOR DEPOSITION;
SOFTWARE PACKAGE ATLAS;
SOFTWARE PACKAGE VIRTUAL WAFER FAB;
THIN FILM TRANSISTORS;
|
|
EID: 0034837722
PISSN: 10120394
EISSN: None
Source Type: Book Series
DOI: 10.4028/www.scientific.net/ssp.80-81.379 Document Type: Conference Paper |
|
Times cited : (1)
|
|
References (10)
|
