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Journal of Crystal Growth

Volumn 223, Issue 1-2, 2001, Pages 99-103

X-ray evidence for Ge/Si(0 0 1) island columns in multilayer structure

(7) Huang, C J a Tang, Y a Li, D Z a Cheng, B W a Luo, L P a Yu, J Z a Wang, Q M a

a INSTITUTE OF SEMICONDUCTORS (China)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; MULTILAYERS; NANOSTRUCTURED MATERIALS; SEMICONDUCTING GERMANIUM; SEMICONDUCTING SILICON; TRANSMISSION ELECTRON MICROSCOPY; VAPOR PHASE EPITAXY; X RAY CRYSTALLOGRAPHY;

ISLAND COLUMNS;

SEMICONDUCTING FILMS;

EID: 0034833259 PISSN: 00220248 EISSN: None Source Type: Journal
DOI: 10.1016/S0022-0248(00)01024-1 Document Type: Article

Times cited : (3)

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