X-ray-induced radiation damage in CsI, Gadox, Y2O2S and Y2O3 thin films

Nuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment

Volumn 459, Issue 3, 2001, Pages 543-551

  Tremsin, A S ^a,b   Pearson, J F ^a   Nichols, A P ^a   Owens, A ^a,c   Brunton, A N ^a   Fraser, G W ^a  

^a UNIVERSITY OF LEICESTER   (United Kingdom)

^b UNIVERSITY OF CALIFORNIA   (United States)

^c EUROPEAN SPACE AGENCY   (Netherlands)

Author keywords

[No Author keywords available]

Indexed keywords

BORON COMPOUNDS; CESIUM COMPOUNDS; OXIDES; SULFUR COMPOUNDS; X RAYS; YTTRIUM COMPOUNDS;

RADIATION HARDENESS;

RADIATION DAMAGE;

EID: 0034831561     PISSN: 01689002     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0168-9002(00)01059-7     Document Type: Article

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