Synchrotron measurements of the absolute X-ray quantum efficiency of CsI-coated microchannel plates

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 3445, Issue , 1998, Pages 384-392

  Rideout, R M ^a   Pearson, J F ^a   Fraser, G W ^a   Lees, J E ^a   Brunton, A N ^a   Bannister, N P ^a   Kenter, A ^a   Kraft, R ^a  

^a UNIVERSITY OF LEICESTER   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

ASTROPHYSICS; CALIBRATION; CESIUM COMPOUNDS; PHOTOCATHODES; PROPORTIONAL COUNTERS; QUANTUM EFFICIENCY; SYNCHROTRON RADIATION;

ADVANCED X RAY ASTROPHYSICS FACILITY (AXAF); MICROCHANNEL PLATES; X RAY DETECTORS;

SEMICONDUCTOR COUNTERS;

EID: 0032301130     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (20)