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Volumn , Issue , 2001, Pages 564-570

Advanced thermal interface materials for enhanced flip chip BGA

Author keywords

[No Author keywords available]

Indexed keywords

ADHESION; ADHESIVES; COPPER; FLIP CHIP DEVICES; HEAT RESISTANCE; HEAT SINKS; INTERFACES (MATERIALS); SILICON; SILVER; TEMPERATURE CONTROL; THERMAL CYCLING; THERMAL EXPANSION;

EID: 0034829095     PISSN: 05695503     EISSN: None     Source Type: Journal    
DOI: 10.1109/ECTC.2001.927784     Document Type: Article
Times cited : (26)

References (25)
  • 1
    • 85013974990 scopus 로고
    • American Society for Testing and Materials, method: D5470 - 95 (September)
    • (1995)
  • 5
    • 85013883725 scopus 로고    scopus 로고
    • Mathis Instruments Ltd., New Brunswick
  • 6
    • 11744336762 scopus 로고
    • A flash method of determining thermal diffusivity, heat capacity and thermal conductivity
    • (1961) J. Appl. Phys , vol.32 , Issue.1679
    • Parker, W.J.1
  • 12
    • 23544461255 scopus 로고    scopus 로고
    • Thermal effusivity as a void or delamination measurement
    • Mathis Instruments Ltd., New Brunswick
    • Chandler, C.1    Mathis, N.2
  • 15
  • 19
    • 0003726257 scopus 로고
    • Markets, applications and technology of precious metal flakes
    • (1992) Precious Metals , vol.16 , pp. 265
    • Jost, E.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.