Measurement and evaluation of thermal transients

Conference Record - IEEE Instrumentation and Measurement Technology Conference

Volumn 1, Issue , 2001, Pages 210-215

  Szekely V ^a   Torok S ^a   Nikodemusz E ^a   Farkas, G ^a   Rencz, M ^a  

^a BUDAPEST UNIVERSITY OF TECHNOLOGY AND ECONOMICS   (Hungary)

Author keywords

[No Author keywords available]

Indexed keywords

CMOS INTEGRATED CIRCUITS; ELECTRONICS PACKAGING; GATES (TRANSISTOR); HEAT RESISTANCE; MATHEMATICAL MODELS; MOSFET DEVICES; THERMAL VARIABLES MEASUREMENT;

THERMAL DESIGN; THERMAL TRANSIENT MEASUREMENT;

THERMODYNAMIC PROPERTIES;

EID: 0034822503     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (13)

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3. Analysis of laser diode thermal properties with spatial resolution by means of the TRAIT method
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6. On the representation of infinite-length distributed RC one-ports
7. Bayesian deconvolution I. Convergent properties
8. Identification of RC networks by deconvolution: Chances and limits
9. THERMODEL: A tool for compact dynamic thermal model generation
10. New approaches in the transient thermal measurements
11. Convolution calculus in the network theory and identification
12. A new evaluation method of thermal transient measurement results