Fast and accurate analysis of the multiconductor interconnects

Microelectronic Engineering

Volumn 55, Issue 1-4, 2001, Pages 37-42

  Ymeri, H ^a   Nauwelaers, B ^a   Maex, K ^a,b   De Roest, D ^b  

^a UNIVERSITY OF LEUVEN   (Belgium)

^b IMEC   (Belgium)

Author keywords

[No Author keywords available]

Indexed keywords

CAPACITANCE MEASUREMENT; COMPUTATIONAL COMPLEXITY; ELECTROSTATICS; GREEN'S FUNCTION; INTEGRATED CIRCUIT LAYOUT; MULTILAYERS;

MULTICONDUCTOR INTERCONNECTS; QUASI-ANALYTIC ELECTROSTATIC GREEN FUNCTIONS;

INTERCONNECTION NETWORKS;

EID: 0034818691     PISSN: 01679317     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0167-9317(00)00426-3     Document Type: Article

References (7)

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