Fast parameter extraction for multiconductor interconnects in multilayered dielectric media using mixture method of equivalent source and measured equation of invariance

IEEE Transactions on Components Packaging and Manufacturing Technology Part B

Volumn 20, Issue 3, 1997, Pages 235-240

  Jin, Ronghong ^a   Cao, Yi ^a   Li, Zhengfan ^a  

^a SHANGHAI JIAO TONG UNIVERSITY   (China)

Author keywords

Equivalent principle; Interconnects; MEI method; Multiconductor; Multilayered dielectric media; Parameter extraction

Indexed keywords

COMPUTATIONAL METHODS; DIELECTRIC MATERIALS; ELECTRIC NETWORK ANALYSIS; ELECTRIC NETWORK PARAMETERS; GREEN'S FUNCTION; PRINTED CIRCUIT BOARDS;

FAST PARAMETER EXTRACTION; MEASURED EQUATION OF INVARIANCE (MEI); MULTICONDUCTOR INTERCONNECTS; MULTILAYERED DIELECTRIC MEDIA;

ELECTRONICS PACKAGING;

EID: 0031198648     PISSN: 10709894     EISSN: None     Source Type: Journal    
DOI: 10.1109/96.618222     Document Type: Article

References (19)

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