Strategies for optimum use of superposition diffractogram in scanning electron microscopy

Scanning

Volumn 23, Issue 5, 2001, Pages 351-356

  Oho, E ^a   Toyomura, K ^a  

^a KOGAKUIN UNIVERSITY   (Japan)

Author keywords

Digital scan; Image processing; Resolution; Scanning electron microscope; Superposition diffractogram

Indexed keywords

CORRELATION METHODS; FOURIER TRANSFORMS; IMAGE ANALYSIS; MAGNETIC FIELD EFFECTS; OPTICAL RESOLVING POWER; SAMPLING; SCANNING; SCANNING ELECTRON MICROSCOPY;

SUPERPOSITION DIFFRACTOGRAM;

DIFFRACTIVE OPTICS;

ARTICLE; FOURIER TRANSFORMATION; GENERATOR; IMAGE PROCESSING; MAGNETIC FIELD; PRIORITY JOURNAL; SCANNING ELECTRON MICROSCOPY; VIBRATION;

EID: 0034802328     PISSN: 01610457     EISSN: None     Source Type: Journal    
DOI: 10.1002/sca.4950230509     Document Type: Article

References (9)

1. Imaging in scanning electron microscopy
2. On-line computation of diffractograms for the analysis of SEM images
3. Reduction of noise in TV rate electron microscope images by digital filtering
4. Observation of the relative phases of electron microscopic phase contrast zones with the aid of the optical diffractometer
5. The necessity and utility of a scanning electron microscope with 4096 lines
6. Proper acquisition and handling of SEM images using a high-performance personal computer
7. New generation scanning electron microscopy technology based on the concept of active image processing
8. Quality control of SEM micrographs by laser diffractometry