메뉴 건너뛰기




Volumn 18, Issue 2, 1996, Pages 72-80

Proper acquisition and handling of scanning electron microscopy images using a high-performance personal computer

Author keywords

aliasing error; digital acquisition; digital expansion; high density sampling; personal computer

Indexed keywords

ANALOG TO DIGITAL CONVERSION; DATA ACQUISITION; DATA HANDLING; ERRORS; IMAGE PROCESSING; IMAGE QUALITY; PERSONAL COMPUTERS; SIGNAL TO NOISE RATIO;

EID: 0030110967     PISSN: 01610457     EISSN: None     Source Type: Journal    
DOI: 10.1002/sca.1996.4950180202     Document Type: Article
Times cited : (11)

References (17)
  • 2
    • 0019306303 scopus 로고
    • Imaging in scanning electron microscopy
    • Crewe AV: Imaging in scanning electron microscopy. Ultramicroscopy 5, 131-138 (1980)
    • (1980) Ultramicroscopy , vol.5 , pp. 131-138
    • Crewe, A.V.1
  • 3
    • 0019709115 scopus 로고
    • Optimal scanning and image processing with the STEM
    • Crewe AV, Ohtsuki M: Optimal scanning and image processing with the STEM. Ultramicroscopy 7, 13-18 (1981)
    • (1981) Ultramicroscopy , vol.7 , pp. 13-18
    • Crewe, A.V.1    Ohtsuki, M.2
  • 4
    • 84984059652 scopus 로고
    • Digital image recording and processing using an Apple II microcomputer
    • Desai V, Reimer L: Digital image recording and processing using an Apple II microcomputer. Scanning 7, 185-197 (1985)
    • (1985) Scanning , vol.7 , pp. 185-197
    • Desai, V.1    Reimer, L.2
  • 6
    • 0020321276 scopus 로고
    • Microcomputer control of a STEM
    • Joy DC: Microcomputer control of a STEM. Ultramicroscopy 8, 301-308 (1982)
    • (1982) Ultramicroscopy , vol.8 , pp. 301-308
    • Joy, D.C.1
  • 7
    • 0027097038 scopus 로고
    • Automatic contrast adjustment for detail recognition in SEM images using on-line digital image processing
    • Oho E: Automatic contrast adjustment for detail recognition in SEM images using on-line digital image processing. Scanning 14, 335-344 (1992)
    • (1992) Scanning , vol.14 , pp. 335-344
    • Oho, E.1
  • 8
    • 0029984616 scopus 로고
    • A practical method for noise removal in scanning electron microscopy
    • Oho E, Ichise N, Peters K-R, Martin W: A practical method for noise removal in scanning electron microscopy. Scanning 18, 50-59 (1995)
    • (1995) Scanning , vol.18 , pp. 50-59
    • Oho, E.1    Ichise, N.2    Peters, K.-R.3    Martin, W.4
  • 9
    • 0025280730 scopus 로고
    • The utility of an on-line digital image recording system for SEM
    • Oho E, Kanaya K: The utility of an on-line digital image recording system for SEM. Scanning 12, 141-146 (1990)
    • (1990) Scanning , vol.12 , pp. 141-146
    • Oho, E.1    Kanaya, K.2
  • 10
    • 84986501670 scopus 로고
    • Automatic measurement of scanning beam diameter using an on-line digital computer
    • Oho E, Kobayasi M, Sasaki T, Adachi K, Kanaya K: Automatic measurement of scanning beam diameter using an on-line digital computer. J Electron Microsc Tech 3, 159-167 (1986a)
    • (1986) J Electron Microsc Tech , vol.3 , pp. 159-167
    • Oho, E.1    Kobayasi, M.2    Sasaki, T.3    Adachi, K.4    Kanaya, K.5
  • 11
    • 0026006351 scopus 로고
    • A method using on-line digital computer for improvement of resolution of backscattered electron images
    • Oho E, Ogihara A, Kanaya K: A method using on-line digital computer for improvement of resolution of backscattered electron images. J Microsc 164, 143-152 (1991)
    • (1991) J Microsc , vol.164 , pp. 143-152
    • Oho, E.1    Ogihara, A.2    Kanaya, K.3
  • 12
    • 0028191453 scopus 로고
    • Practical methods for digital image enhancement in SEM
    • Oho E, Peters K-R: Practical methods for digital image enhancement in SEM. J Electron Microsc 43, 299-306 (1994)
    • (1994) J Electron Microsc , vol.43 , pp. 299-306
    • Oho, E.1    Peters, K.-R.2
  • 13
    • 84986464737 scopus 로고
    • A comparison of on-line digital recording with conventional photographic recording for scanning electron microscopy
    • Oho E, Sasaki T, Kanaya K: A comparison of on-line digital recording with conventional photographic recording for scanning electron microscopy. J Electron Microsc Tech 4, 157-162 (1986b)
    • (1986) J Electron Microsc Tech , vol.4 , pp. 157-162
    • Oho, E.1    Sasaki, T.2    Kanaya, K.3
  • 14
    • 9044237596 scopus 로고
    • Combined SEM-minicomputer system for digital image processing
    • Ed. Johari O. Part I. IIT Res Inst, Chicago
    • Oron M, Gilbert D: Combined SEM-minicomputer system for digital image processing. Proc 9th Ann Conf Scanning Electron Microscopy Symp (Ed. Johari O). Part I. IIT Res Inst, Chicago (1976) 120-127
    • (1976) Proc 9th Ann Conf Scanning Electron Microscopy Symp , pp. 120-127
    • Oron, M.1    Gilbert, D.2
  • 15
    • 9044253250 scopus 로고
    • Springer Series in Optical Sciences, Springer-Verlag
    • Reimer L: Scanning Electron Microscopy. Springer Series in Optical Sciences, Vol.45, Springer-Verlag (1985) 213-226
    • (1985) Scanning Electron Microscopy , vol.45 , pp. 213-226
    • Reimer, L.1
  • 16
    • 0017291298 scopus 로고
    • The application of the minicomputer in scanning electron microscopy
    • TAL Int'l Pub. Co., Jerusalem
    • Unitt BM, Smith KCA: The application of the minicomputer in scanning electron microscopy. Proc 6th European Cong Electron Microsc (Vol. 1). TAL Int'l Pub. Co., Jerusalem, (1976) 162-167
    • (1976) Proc 6th European Cong Electron Microsc , vol.1 , pp. 162-167
    • Unitt, B.M.1    Smith, K.C.A.2
  • 17
    • 0015958858 scopus 로고
    • Signal storage and enhancement techniques for the SEM
    • Ed. Johari O. Part. I. ITT Res Inst, Chicago
    • Yew NC, Pease DE: Signal storage and enhancement techniques for the SEM. Proc 7th Ann Conf Scanning Electron Microscopy Symp (Ed. Johari O). Part. I. ITT Res Inst, Chicago (1974) 191-198
    • (1974) Proc 7th Ann Conf Scanning Electron Microscopy Symp , pp. 191-198
    • Yew, N.C.1    Pease, D.E.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.