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Volumn 4450, Issue , 2001, Pages 33-43

Metrology for the optoelectronics industry

Author keywords

Lasers; Metrology; Optical communications; Optoelectronics

Indexed keywords

FREQUENCY STANDARDS; LASERS; OPTICAL COMMUNICATION; OPTOELECTRONIC DEVICES;

EID: 0034780793     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.431251     Document Type: Conference Paper
Times cited : (1)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.