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Volumn 32, Issue 10, 2001, Pages 885-891

Temperature-dependent structural characterization of sol-gel deposited strontium titanate (SrTiO3) thin films using Raman spectroscopy

(4) Vivoni, Alberto a Chen, Shi Ping b Qiao, Zhuanhong b Hosten, Charles M b

a Department of Biology Chemistry and Environmental Science (United States)

b HOWARD UNIVERSITY (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ALUMINA; ALUMINUM OXIDE; CRYSTAL SYMMETRY; FERROELECTRIC FILMS; FERROELECTRICITY; OPTICAL LATTICES; OXYGEN VACANCIES; PEROVSKITE; PHONONS; RAMAN SCATTERING; RAMAN SPECTROSCOPY; SAPPHIRE; SINGLE CRYSTALS; SOL-GEL PROCESS; SOL-GELS; STRONTIUM TITANATES; TEMPERATURE DISTRIBUTION; X RAY DIFFRACTION;

FIRST ORDER; M-PLANE; OPTICAL PHONONS; PLANE SAPPHIRE; SOL'GEL; STRUCTURAL CHARACTERIZATION; TEMPERATURE DEPENDENCE; TEMPERATURE DEPENDENT; THIN-FILMS; WAVE NUMBERS;

THIN FILMS;

ALUMINUM OXIDE; PEROVSKITE; STRONTIUM; TITANIUM DERIVATIVE;

ARTICLE; CRYSTAL; DYNAMICS; FILM; GEL; OXYGENATION; RAMAN SPECTROMETRY; TEMPERATURE DEPENDENCE; X RAY DIFFRACTION;

EID: 0034777687 PISSN: 03770486 EISSN: None Source Type: Journal
DOI: 10.1002/jrs.752 Document Type: Article

Times cited : (15)

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