Ultra-trace analytical monitoring of silicon wafer surfaces by capillary electrophoresis

Analytical and Bioanalytical Chemistry

Volumn 371, Issue 4, 2001, Pages 407-412

  Ehmann, T ^a   Fabry, L ^a   Kotz, L ^a   Pahlke, S ^a  

^a SILTRONIC AG   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

BIOMATERIAL; SILICON DIOXIDE;

ARTICLE; CAPILLARY ELECTROPHORESIS; METHODOLOGY; REPRODUCIBILITY;

COATED MATERIALS, BIOCOMPATIBLE; ELECTROPHORESIS, CAPILLARY; REPRODUCIBILITY OF RESULTS; SILICON DIOXIDE;

EID: 0034775631     PISSN: 16182642     EISSN: None     Source Type: Journal    
DOI: 10.1007/s002160101007     Document Type: Article

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