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Volumn 206-213, Issue II, 2001, Pages 1025-1028
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Measurements of surface residual stresses in Si3N4 based laminates by Raman spectroscopy
a
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Author keywords
Fracture toughness; Laminates; Raman spectroscopy; Silicon nitride; Strength; Surface residual stresses
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Indexed keywords
COMPRESSIVE STRESS;
FRACTURE TOUGHNESS;
RAMAN SPECTROSCOPY;
RESIDUAL STRESSES;
SILICON NITRIDE;
SURFACE MEASUREMENT;
TENSILE STRESS;
SURFACE RESIDUAL STRESS;
LAMINATED COMPOSITES;
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EID: 0034772320
PISSN: 10139826
EISSN: 16629795
Source Type: Book Series
DOI: None Document Type: Conference Paper |
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Times cited : (4)
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References (11)
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