In situ measurement of bridging stresses in toughened silicon nitride using raman microprobe spectroscopy

Journal of the American Ceramic Society

Volumn 82, Issue 5, 1999, Pages 1249-1256

  Pezzotti, Giuseppe ^a,c   Muraki, Naoki ^b   Maeda, Naoki ^a   Satou, Kouji ^a   Nishida, Toshihiko ^a,c  

^a KYOTO INSTITUTE OF TECHNOLOGY   (Japan)

^b TORAY RESEARCH CENTER INC   (Japan)

^c AMERICAN CERAMIC SOCIETY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0001298036     PISSN: 00027820     EISSN: None     Source Type: Journal    
DOI: 10.1111/j.1151-2916.1999.tb01903.x     Document Type: Article

References (17)

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