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Volumn 104, Issue 3-4, 2001, Pages 325-343

Stochastic simulation of soil strength/compaction and assessment of corn yield risk using threshold probability patterns

(5) Lapen, D R a Topp, G C a Hayhoe, H N a Gregorich, E G a Curnoe, W E b

a OTTAWA RESEARCH AND DEVELOPMENT CENTRE (Canada)

b UNIVERSITY OF GUELPH (Canada)

Author keywords

Cone penetration resistance; Corn yield risk; Sequential Gaussian simulation; Spatial variability

Indexed keywords

COMPACTION; CONE PENETRATION TEST; CROP YIELD; SOIL STRENGTH; SPATIAL VARIATION;

EID: 0034761733 PISSN: 00167061 EISSN: None Source Type: Journal
DOI: 10.1016/S0016-7061(01)00088-X Document Type: Article

Times cited : (20)

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