Semi-automated analysis of three-dimensional track images

Radiation Measurements

Volumn 34, Issue 1-6, 2001, Pages 161-165

  Meesen, G ^a   Poffijn, A ^a  

^a GHENT UNIVERSITY   (Belgium)

Author keywords

[No Author keywords available]

Indexed keywords

ALPHA PARTICLES; CODES (SYMBOLS); ETCHING; IMAGE QUALITY; JAVA PROGRAMMING LANGUAGE; MICROSCOPIC EXAMINATION; PARTICLE DETECTORS;

CONFOCAL SCANNING LASER MICROSCOPE (CSLM); DECONVOLUTION TECHNIQUES;

IMAGE ANALYSIS;

EID: 0034742303     PISSN: 13504487     EISSN: None     Source Type: Journal    
DOI: 10.1016/S1350-4487(01)00143-3     Document Type: Conference Paper

References (7)

1. Electrochemically etched tracks by means of confocal microscopy
2. Use of a CSLM for the analysis of chemical etched tracks in PADC
3. Ellipse-specific direct least-square fitting
4. 3-d track analysis using a confocal laser scanning microscope
5. Using a confocal microscope for the extraction of track parameters in CR-39 SSNTD's