SCOPUS 정보 검색 플랫폼

Solar Energy Materials and Solar Cells

Volumn 63, Issue 4, 2000, Pages 335-345

Depth profile analysis of CuInSe2 (CIS) thin films grown by the electrodeposition technique

(2) Calixto, M E a Sebastian, P J a

a INSTITUTO DE CIENCIAS FÍSICAS (Mexico)

Author keywords

[No Author keywords available]

Indexed keywords

AUGER ELECTRON SPECTROSCOPY; ELECTRODEPOSITION; FILM GROWTH; PLASMA APPLICATIONS; POLYCRYSTALLINE MATERIALS; SEMICONDUCTING FILMS; SEMICONDUCTING INDIUM COMPOUNDS; SEMICONDUCTOR GROWTH; THIN FILM DEVICES;

COPPER INDIUM DISELENIDE; DEPTH PROFILING; INDUCTIVELY-COUPLED PLASMA (ICP) SPECTROSCOPY;

SOLAR CELLS;

EID: 0034738861 PISSN: 09270248 EISSN: None Source Type: Journal
DOI: 10.1016/S0927-0248(00)00053-2 Document Type: Article

Times cited : (18)

References (8)

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- (1996) Proceedings of the 1996 Spring MRS Meeting
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2
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- Pal, R.¹ Chattopadhyay, K.K.² Chaudhruri, S.³ Pal, A.K.⁴

3
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- Varela, M.¹ Beltran, E.² Manchon, M.³ Esteve, J.⁴ Morenza, J.L.⁵

4
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- J.C. Garg, R.P. Sharma, K.C. Sharma, Thin Solid Film 164 (1988) 269.
- (1988) Thin Solid Film , vol.164 , pp. 269
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5
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8
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- P.J. Sebastian, M.E. Calixto, R.N. Bhattacharya, Rommel Noufi, Solar Energy Materials and Solar Cells 59 (1999) 125-135.
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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.