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International Journal of Modern Physics B

Volumn 14, Issue 2-3, 2000, Pages 321-332

Characterization of ta-C and granular Co-C films prepared by pulsed filtered vacuum arc deposition

(9) Wong, S P a Wang, H b Ke, N a Cheung, W Y a Chiah, M F a Chen, D H a Li, Q J a Liu, H c Zhang, X X c

a CHINESE UNIVERSITY OF HONG KONG (Hong Kong)

b Wuyi University (China)

c HONG KONG UNIVERSITY OF SCIENCE AND TECHNOLOGY (Hong Kong)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; CONFERENCE PAPER; ELECTRIC ACTIVITY; ELECTRIC RESISTANCE; FILM; FILTER; MAGNETISM; MEASUREMENT; RAMAN SPECTROMETRY; SYSTEM ANALYSIS; TEMPERATURE; THEORY; VACUUM;

EID: 0034731788 PISSN: 02179792 EISSN: None Source Type: Journal
DOI: 10.1142/s0217979200000339 Document Type: Conference Paper

Times cited : (15)

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