Quantum-critical conductivity scaling for a metal-insulator transition

Science

Volumn 287, Issue 5453, 2000, Pages 633-636

  Lee, H L ^a   Carini, John P ^a   Baxter, David V ^a   Henderson, W ^b   Gruner C ^b  

^a INDIANA UNIVERSITY   (United States)

^b UNIVERSITY OF CALIFORNIA   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CARBON; NANOPARTICLE;

ARTICLE; PRIORITY JOURNAL; SCANNING ELECTRON MICROSCOPY; STRESS STRAIN RELATIONSHIP; TENSILE STRENGTH; TRANSMISSION ELECTRON MICROSCOPY; TUBE; YOUNG MODULUS;

EID: 0034723224     PISSN: 00368075     EISSN: None     Source Type: Journal    
DOI: 10.1126/science.287.5453.633     Document Type: Article

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18. We thank E. Abrahams, S. Girvin, A. Kapitulnik, and S. Sachdev for comments on this work. Research at Indiana was supported by NSF grants DMR-9314018 and DMR-9423088; research at UCLA was supported by NSF grant DMR-9801816.