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Physical Review B - Condensed Matter and Materials Physics

Volumn 62, Issue 19, 2000, Pages 12927-12931

Strain effects of missing dimer defects on dimer buckling of the Si(100) surface

(4) Okamoto, Masakuni a Yokoyama, Takashi a Uda, Tsuyoshi b Takayanagi, Kunio c

a JAPAN SCIENCE AND TECHNOLOGY AGENCY (Japan)

b JT RES CENTER FOR ATOM TECHNOLOGY (Japan)

c TOKYO INSTITUTE OF TECHNOLOGY (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

DIMER; SILICON;

ARTICLE; CALCULATION; SCANNING TUNNELING MICROSCOPY; SURFACE PROPERTY; SYSTEM ANALYSIS; TEMPERATURE DEPENDENCE;

EID: 0034668621 PISSN: 01631829 EISSN: None Source Type: Journal
DOI: 10.1103/PhysRevB.62.12927 Document Type: Article

Times cited : (5)

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