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Physical Review B - Condensed Matter and Materials Physics

Volumn 62, Issue 16, 2000, Pages 11163-11169

Optical microscopy of single ions and morphological inhomogeneities in Sm-doped CaF2 thin films

(6) Rodrigues Herzog, R a Trotta, F a Bill, H a Segura, J M b Hecht, B b Guntherodt H J c

a UNIVERSITY OF GENEVA (Switzerland)

b ETH ZURICH (Switzerland)

c UNIVERSITY OF BASEL (Switzerland)

Author keywords

[No Author keywords available]

Indexed keywords

CALCIUM FLUORIDE; ION; SAMARIUM;

ARTICLE; ATOMIC FORCE MICROSCOPY; BLEACHING; FILM; LOW TEMPERATURE; LUMINESCENCE; MICROSCOPY; SPECTROSCOPY;

EID: 0034666997 PISSN: 01631829 EISSN: None Source Type: Journal
DOI: 10.1103/PhysRevB.62.11163 Document Type: Article

Times cited : (15)

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