A sample-scanning confocal optical microscope for cryogenic operation

Review of Scientific Instruments

Volumn 71, Issue 4, 2000, Pages 1706-1711

  Segura, J M ^a   Renn, A ^a   Hecht, B ^a  

^a ETH ZURICH   (Switzerland)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0001766822     PISSN: 00346748     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1150524     Document Type: Article

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