Interpretation of scanning probe microscope image of the structure of atomic vacancy on graphite: Ab initio periodic Hartree-Fock calculations

Journal of Molecular Structure: THEOCHEM

Volumn 506, Issue 1-3, 2000, Pages 297-301

  Lee, K H ^a   Causa M ^b   Park, S S ^a   Lee, C ^a   Suh, Y ^a   Eun, H M ^a,c   Kim, D ^c  

^a Wonkwang University   (South Korea)

^b UNIVERSITY OF EASTERN PIEDMONT   (Italy)

^c Kunsan National University   (South Korea)

Author keywords

Ab initio periodic Hartree Fock method; Atomic force microscope; Defect; Graphite; Scanning tunneling microscope

Indexed keywords

GRAPHITE;

ATOM; ATOMIC FORCE MICROSCOPY; CALCULATION; CHEMICAL STRUCTURE; CONFERENCE PAPER; ENERGY; IMAGE ANALYSIS; SCANNING TUNNELING MICROSCOPY;

EID: 0034647863     PISSN: 01661280     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0166-1280(00)00421-8     Document Type: Conference Paper

References (16)

1. Kushmerick J.G., Kelly K.F., Rust H.P., Halas N.J., Weiss P.S. J. Phys. Chem. B. 103:1999;1619.
2. Kappel M., Steidl M., Biener J., Kuppers J. Surf. Sci. 387:1997;L1062.
3. Begrambekov L., Vergazov S., Zakharov A., Morochev M. Nucl. Instr. Meth. B: Phys. Res. 90:1994;491.
4. Kelly K.F., Halas N.J. Surf. Sci. 416:1998;L1085.
5. Durand H.A., Sekine K., Etoh K., Ito K., Kataoka I. Thin Solid Films. 336:1998;1998.
6. Hahn J.R., Kang H., Song S., Jeon I.C. Phys. Rev. B. 53:1996;R1725.
7. Lee K.H., Lee H.M., Eun H.M., Lee W.R., Kim S., Kim D. Surf. Sci. 321:1994;267.
8. Soto M.R. J. Microscopy. 152:1988;779.
9. Nordlund K., Keinonen J., Mattila T. Phys. Rev. Lett. 77:1996;699.
10. Lee S.M., Lee Y.H., Hwang Y.G., Hahn J.R., Kang H. Phys. Rev. Lett. 82:1999;217.
11. R. Dovesi, V.R. Saunders, C. Roetti, M. Causá, N.M. Harrison, R. Orlando, E. Aprá, CYRSTAL 95 User's Manual, University of Torino, Torino, Italy, 1996.
12. Lee K.H., Causá M., Park S.S. J. Phys. Chem. B. 102:1998;6020.
13. Tersoff J., Hamann D.R. Phys. Rev. Lett. 50:1983;1998.
14. Tersoff J., Hamann D.R. Phys. Rev. B. 31:1985;805.
15. Gordon R.G., Kim Y.S. J. Chem. Phys. 56:1972;3122.
16. Magonov S.N., Whangbo M.-H. Surface Analysis with STM and AFM. 1996;VCH, Weinheim.