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Deutsch, M.6
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M. J. Regan, E. H. Kawamoto, S. Lee, P. S. Pershan, N. Maskil, M. Deutsch, O. M. Magnussen, B. M. Ocko, and L. E. Berman, Phys. Rev. Lett. 75, 2498 (1995).
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Magnussen, O.M.7
Ocko, B.M.8
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9
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M. J. Regan, P. S. Pershan, O. M. Magnussen, B. M. Ocko, M. Deutsch, and L. Berman, Phys. Rev. B 54, 9730 (1996).
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Berman, L.6
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10
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85038329542
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(unpublished). Some pecularities of the Hg surface structure may be due to the fact that Hg cannot be studied under ultrahigh vacuum (UHV). In the present paper, we compare the In results to measurements of liquid Ga, both performed under UHV conditions. A detailed discussion of the temperature dependent surface layering of liquid Hg will be given elsewhere
-
Some pecularities of the Hg surface structure may be due to the fact that Hg cannot be studied under ultrahigh vacuum (UHV). In the present paper, we compare the In results to measurements of liquid Ga, both performed under UHV conditions. A detailed discussion of the temperature dependent surface layering of liquid Hg will be given elsewhere:E. DiMasi, H. Tostmann, B. M. Ocko, P. S. Pershan, and M. Deutsch (unpublished).
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DiMasi, E.1
Tostmann, H.2
Ocko, B.M.3
Pershan, P.S.4
Deutsch, M.5
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de Wijs, G.A.1
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0004223447
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Cambridge University Press, Cambridge, England
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N. H. March, Liquid Metals (Cambridge University Press, Cambridge, England, 1990).
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Liquid Metals
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M. C. Bellissent-Funel, P. Chieux, D. Levesque, and J. J. Weis, Phys. Rev. A 39, 6310 (1989).
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0000395197
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M. J. Regan, H. Tostmann, P. S. Pershan, O. M. Magnussen, E. DiMasi, B. M. Ocko, and M. Deutsch, Phys. Rev. B 55, 10 786 (1997).
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Ocko, B.M.6
Deutsch, M.7
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28
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0001383116
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M. J. Regan, P. S. Pershan, O. M. Magnussen, B. M. Ocko, M. Deutsch, and L. E. Berman, Phys. Rev. B 55, 15 874 (1997).
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Ocko, B.M.4
Deutsch, M.5
Berman, L.E.6
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29
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0021374675
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). The PSD was designed at Brookhaven National Laboratory (BNL) and consists of an 8 cm anode wire with 40 psi Kr/10% (Formula presented) gas optimized for x-ray absorption at 19 keV.
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G. C. Smith, J. Fischer, and V. Radeka, IEEE Trans. Nucl. Sci. NS-32, 521 (1985). The PSD was designed at Brookhaven National Laboratory (BNL) and consists of an 8 cm anode wire with 40 psi Kr/10% (Formula presented) gas optimized for x-ray absorption at 19 keV.
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IEEE Trans. Nucl. Sci.
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Smith, G.C.1
Fischer, J.2
Radeka, V.3
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30
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85038287336
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X-ray photoelectron spectroscopy (XPS) shows that no impurity segregates at the surface of liquid In contained in a Mo pan. The sample was heated up to (Formula presented) for several days and the XPS was taken after cooling the sample. The surface sensitivity of the XPS spectrometer is 1% given a penetration depth of about 30 Å. This is in accordance with the In-Mo phase diagram which predicts no Mo solubility in In at these temperatures [T. B. Massalski, Binary Alloy Phase Diagram (ASM International, Materials Park, OH, 1990)].
-
X-ray photoelectron spectroscopy (XPS) shows that no impurity segregates at the surface of liquid In contained in a Mo pan. The sample was heated up to (Formula presented) for several days and the XPS was taken after cooling the sample. The surface sensitivity of the XPS spectrometer is 1% given a penetration depth of about 30 Å. This is in accordance with the In-Mo phase diagram which predicts no Mo solubility in In at these temperatures [T. B. Massalski, Binary Alloy Phase Diagram (ASM International, Materials Park, OH, 1990)].
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33
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85038312429
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JRS Scientific Instruments, Affoltern a.A., Switzerland.
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JRS Scientific Instruments, Affoltern a.A., Switzerland.
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35
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0000096033
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A. Braslau, P. S. Pershan, G. Swislow, B. M. Ocko, and J. Als-Nielsen, Phys. Rev. A 38, 2457 (1988).
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Phys. Rev. A
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Ocko, B.M.4
Als-Nielsen, J.5
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36
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85038312130
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The microscopic definition of the local density profile (Formula presented) requires averaging over density fluctuations with wavelengths shorter than ξ. It follows that fluctuations with surface wave vectors (Formula presented) are contained in the definition of (Formula presented)
-
The microscopic definition of the local density profile (Formula presented) requires averaging over density fluctuations with wavelengths shorter than ξ. It follows that fluctuations with surface wave vectors (Formula presented) are contained in the definition of (Formula presented)
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37
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33744991462
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S. K. Sinha, E. B. Sirota, S. Garoff, and H. B. Stanley, Phys. Rev. B 38, 2297 (1988).
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Sinha, S.K.1
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Stanley, H.B.4
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39
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85038335721
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This cutoff is selected such that the number of capillary modes is equal to the number of surface atoms. Choice of a larger cutoff length would imply that the local density profile includes contributions from averaging over the capillary waves with the shortest wavelengths. First principle arguments that might support such a larger cutoff length are beyond the scope of this paper. A smaller cutoff length on the other hand would imply capillary waves with wavelengths smaller than the particle size which is not physically reasonable.
-
This cutoff is selected such that the number of capillary modes is equal to the number of surface atoms. Choice of a larger cutoff length would imply that the local density profile includes contributions from averaging over the capillary waves with the shortest wavelengths. First principle arguments that might support such a larger cutoff length are beyond the scope of this paper. A smaller cutoff length on the other hand would imply capillary waves with wavelengths smaller than the particle size which is not physically reasonable.
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40
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0000649753
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B. M. Ocko, X. Z. Wu, E. B. Sirota, S. K. Sinha, and M. Deutsch, Phys. Rev. Lett. 72, 242 (1994).
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Ocko, B.M.1
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Deutsch, M.5
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42
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85038334178
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an electronic database can be found at http://www.iamp.tohoku.ac.jp/database/scm/index.html Experimentally determined data for the bulk structure factor (Formula presented) and the pair correlation function (Formula presented) calculated from (Formula presented) can be found in Y. Waseda, The Structure of Non-Crystalline Materials (McGraw-Hill, New York, 1980);
-
Experimentally determined data for the bulk structure factor (Formula presented) and the pair correlation function (Formula presented) calculated from (Formula presented) can be found in Y. Waseda, The Structure of Non-Crystalline Materials (McGraw-Hill, New York, 1980);an electronic database can be found at http://www.iamp.tohoku.ac.jp/database/scm/index.html
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O. Tomagnini, F. Ercolessi, S. Iarlori, F. D. Di Tolla, and E. Tosatti, Phys. Rev. Lett. 76, 1118 (1996).
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44
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Phys. Rev. Lett. (to be published).
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M. Fukuto, R. K. Heilmann, P. S. Pershan, J. A. Griffiths, S. M. Yu, and D. A. Tirrell, Phys. Rev. Lett. (to be published).
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Fukuto, M.1
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Tirrell, D.A.6
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46
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H. Tostmann, E. DiMasi, P. S. Pershan, B. M. Ocko, O. G. Shpyrko, and M. Deutsch, Ber. Bunsenges. Phys. Chem. 102, 1136 (1998).
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Tostmann, H.1
DiMasi, E.2
Pershan, P.S.3
Ocko, B.M.4
Shpyrko, O.G.5
Deutsch, M.6
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