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All data sets were collected on a Enraf Nonius CAD4 or a Nonius Kappa-CCD diffractometer with a rotating anode FR591 (Nonius) used as a radiation source. The following programs were used: EXPRESS (Nonius B. V., 1994) and COLLECT (Nonius B. V., 1998) for data collection; MoIEN (K. Fair, Enraf-Nonius B. V., 1990) and Denzo-SMN (Z. Otwinowski, W. Minor, Methods Enzymol. 1997, 276, 307-326) for data reduction; SORTAV for absorption correction of CCD-Data (R. H. Blessing, Acta Crystallogr. Sect. A 1995, 51, 33-37; R. H. Blessing, J. Appl. Crystallogr. 1997, 30, 421 -426); SHELXS-97 (G. M. Sheldrick, Acta Crystallogr. Sect. A 1990, 46, 467-473) for structure solution; SHELXL-97 (G. M. Sheldrick, Universität Göttingen, 1997) for structure refinement. Crystallographic data (excluding structure factors) for the structures reported in this paper have been deposited with the Cambridge Crystallographic Data Centre as supplementary publication no. CCDC-139113 (5) and CCDC-139114 (6). Copies of the data can be obtained free of charge on application to CCDC, 12 Union Road. Cambridge CB21EZ, UK (fax: (+44)1223- 336-033; e-mail: deposit@ccdc.cam.ac.uk).
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All data sets were collected on a Enraf Nonius CAD4 or a Nonius Kappa-CCD diffractometer with a rotating anode FR591 (Nonius) used as a radiation source. The following programs were used: EXPRESS (Nonius B. V., 1994) and COLLECT (Nonius B. V., 1998) for data collection; MoIEN (K. Fair, Enraf-Nonius B. V., 1990) and Denzo-SMN (Z. Otwinowski, W. Minor, Methods Enzymol. 1997, 276, 307-326) for data reduction; SORTAV for absorption correction of CCD-Data (R. H. Blessing, Acta Crystallogr. Sect. A 1995, 51, 33-37; R. H. Blessing, J. Appl. Crystallogr. 1997, 30, 421 -426); SHELXS-97 (G. M. Sheldrick, Acta Crystallogr. Sect. A 1990, 46, 467-473) for structure solution; SHELXL-97 (G. M. Sheldrick, Universität Göttingen, 1997) for structure refinement. Crystallographic data (excluding structure factors) for the structures reported in this paper have been deposited with the Cambridge Crystallographic Data Centre as supplementary publication no. CCDC-139113 (5) and CCDC-139114 (6). Copies of the data can be obtained free of charge on application to CCDC, 12 Union Road. Cambridge CB21EZ, UK (fax: (+44)1223- 336-033; e-mail: deposit@ccdc.cam.ac.uk).
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0642270732
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All data sets were collected on a Enraf Nonius CAD4 or a Nonius Kappa-CCD diffractometer with a rotating anode FR591 (Nonius) used as a radiation source. The following programs were used: EXPRESS (Nonius B. V., 1994) and COLLECT (Nonius B. V., 1998) for data collection; MoIEN (K. Fair, Enraf-Nonius B. V., 1990) and Denzo-SMN (Z. Otwinowski, W. Minor, Methods Enzymol. 1997, 276, 307-326) for data reduction; SORTAV for absorption correction of CCD-Data (R. H. Blessing, Acta Crystallogr. Sect. A 1995, 51, 33-37; R. H. Blessing, J. Appl. Crystallogr. 1997, 30, 421 -426); SHELXS-97 (G. M. Sheldrick, Acta Crystallogr. Sect. A 1990, 46, 467-473) for structure solution; SHELXL-97 (G. M. Sheldrick, Universität Göttingen, 1997) for structure refinement. Crystallographic data (excluding structure factors) for the structures reported in this paper have been deposited with the Cambridge Crystallographic Data Centre as supplementary publication no. CCDC-139113 (5) and CCDC-139114 (6). Copies of the data can be obtained free of charge on application to CCDC, 12 Union Road. Cambridge CB21EZ, UK (fax: (+44)1223- 336-033; e-mail: deposit@ccdc.cam.ac.uk).
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84943920736
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All data sets were collected on a Enraf Nonius CAD4 or a Nonius Kappa-CCD diffractometer with a rotating anode FR591 (Nonius) used as a radiation source. The following programs were used: EXPRESS (Nonius B. V., 1994) and COLLECT (Nonius B. V., 1998) for data collection; MoIEN (K. Fair, Enraf-Nonius B. V., 1990) and Denzo-SMN (Z. Otwinowski, W. Minor, Methods Enzymol. 1997, 276, 307-326) for data reduction; SORTAV for absorption correction of CCD-Data (R. H. Blessing, Acta Crystallogr. Sect. A 1995, 51, 33-37; R. H. Blessing, J. Appl. Crystallogr. 1997, 30, 421 -426); SHELXS-97 (G. M. Sheldrick, Acta Crystallogr. Sect. A 1990, 46, 467-473) for structure solution; SHELXL-97 (G. M. Sheldrick, Universität Göttingen, 1997) for structure refinement. Crystallographic data (excluding structure factors) for the structures reported in this paper have been deposited with the Cambridge Crystallographic Data Centre as supplementary publication no. CCDC-139113 (5) and CCDC-139114 (6). Copies of the data can be obtained free of charge on application to CCDC, 12 Union Road. Cambridge CB21EZ, UK (fax: (+44)1223- 336-033; e-mail: deposit@ccdc.cam.ac.uk).
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All data sets were collected on a Enraf Nonius CAD4 or a Nonius Kappa-CCD diffractometer with a rotating anode FR591 (Nonius) used as a radiation source. The following programs were used: EXPRESS (Nonius B. V., 1994) and COLLECT (Nonius B. V., 1998) for data collection; MoIEN (K. Fair, Enraf-Nonius B. V., 1990) and Denzo-SMN (Z. Otwinowski, W. Minor, Methods Enzymol. 1997, 276, 307-326) for data reduction; SORTAV for absorption correction of CCD-Data (R. H. Blessing, Acta Crystallogr. Sect. A 1995, 51, 33-37; R. H. Blessing, J. Appl. Crystallogr. 1997, 30, 421 -426); SHELXS-97 (G. M. Sheldrick, Acta Crystallogr. Sect. A 1990, 46, 467-473) for structure solution; SHELXL-97 (G. M. Sheldrick, Universität Göttingen, 1997) for structure refinement. Crystallographic data (excluding structure factors) for the structures reported in this paper have been deposited with the Cambridge Crystallographic Data Centre as supplementary publication no. CCDC-139113 (5) and CCDC-139114 (6). Copies of the data can be obtained free of charge on application to CCDC, 12 Union Road. Cambridge CB21EZ, UK (fax: (+44)1223-336-033; e-mail: deposit@ccdc.cam.ac.uk).
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Sheldrick, G.M.1
|