-
1
-
-
0029659563
-
-
S. K. Saxena et al., Science 274, 1357 (1996)
-
(1996)
Science
, vol.274
, pp. 1357
-
-
Saxena, S.K.1
-
2
-
-
0032469246
-
-
S. K. Saxena, L. S. Dubrovinsky, P. Lazor, J. Hu, Eur. J. Mineral. 10, 1275 (1998).
-
(1998)
Eur. J. Mineral.
, vol.10
, pp. 1275
-
-
Saxena, S.K.1
Dubrovinsky, L.S.2
Lazor, P.3
Hu, J.4
-
4
-
-
0000084964
-
-
E. C. T. Chao, J. J. Fahey, J. Littler, D. J. Milton, J. Geophys. Res. 67, 419 (1962).
-
(1962)
J. Geophys. Res.
, vol.67
, pp. 419
-
-
Chao, E.C.T.1
Fahey, J.J.2
Littler, J.3
Milton, D.J.4
-
6
-
-
2342558101
-
-
Wiley & Sons, New York
-
_ and P. H. Abelson, Eds., Research in Geochemistry (Wiley & Sons, New York, 1967), vol. 2, p. 204.
-
(1967)
Research in Geochemistry
, vol.2
, pp. 204
-
-
Abelson, P.H.1
-
7
-
-
0003846171
-
-
Greenbelt, MD Mono Book Co., Baltimore
-
E. C. T. Chao, B. M. French, N. M. Short, Eds., Shock Metamorphism of Natural Materials, Greenbelt, MD (Mono Book Co., Baltimore, 1968).
-
(1968)
Shock Metamorphism of Natural Materials
-
-
Chao, E.C.T.1
French, B.M.2
Short, N.M.3
-
10
-
-
0028792960
-
-
K. Kingma, R. E. Cohen, R. J. Hemley, H.-K. Mao, Nature 374, 243 (1995).
-
(1995)
Nature
, vol.374
, pp. 243
-
-
Kingma, K.1
Cohen, R.E.2
Hemley, R.J.3
Mao, H.-K.4
-
13
-
-
0000629437
-
-
D. M. Teter, R. J. Hemley, G. Kresse, J. Hafner, Phys. Rev. Lett. 80, 2145 (1998).
-
(1998)
Phys. Rev. Lett.
, vol.80
, pp. 2145
-
-
Teter, D.M.1
Hemley, R.J.2
Kresse, G.3
Hafner, J.4
-
15
-
-
0342540500
-
-
in preparation
-
L. S. Dubrovinsky and S. K. Saxena, Phys. Rev. Letters, in preparation; Phys. Chem. Minerals, in preparation.
-
Phys. Chem. Minerals
-
-
-
16
-
-
0004935111
-
-
L. S. Dubrovinsky, A. Belonoshko, N. A. Dubrovinsky, S. K. Saxena, High Pressure Sci. Technol. 1996, 921 (1996)
-
(1996)
High Pressure Sci. Technol.
, vol.1996
, pp. 921
-
-
Dubrovinsky, L.S.1
Belonoshko, A.2
Dubrovinsky, N.A.3
Saxena, S.K.4
-
19
-
-
0002955041
-
-
A. El Goresy, B. Wopencka, M. Chen, G. Kurat, Meteoritics 32, A38 (1997).
-
(1997)
Meteoritics
, vol.32
-
-
El Goresy, A.1
Wopencka, B.2
Chen, M.3
Kurat, G.4
-
20
-
-
0039870066
-
-
T. G. Sharp, A. El Goresy, L. Dubrovinsky, M. Chen, Meteoritics 33, A144 (1998).
-
(1998)
Meteoritics
, vol.33
-
-
Sharp, T.G.1
El Goresy, A.2
Dubrovinsky, L.3
Chen, M.4
-
21
-
-
4244185614
-
-
A. El Goresy, L. Dubrovinsky, S. Saxena, T. G. Sharp, Meteoritics 33, A45 (1998).
-
(1998)
Meteoritics
, vol.33
-
-
El Goresy, A.1
Dubrovinsky, L.2
Saxena, S.3
Sharp, T.G.4
-
23
-
-
0343410101
-
-
note
-
3) at each position of the detector.
-
-
-
-
24
-
-
0342974783
-
-
note
-
The sample disc was mounted on a 0.8-mm hole in a larger steel disc that was loaded onto the goniometer stage for the x-ray studies.
-
-
-
-
25
-
-
0343846041
-
-
note
-
The sample was first scanned with 25-μm mesh to identify the major phases in the sample.
-
-
-
-
27
-
-
0342974782
-
-
note
-
Within the 420-μm-long and 80-μm-wide silica grain, four distinct points were investigated and no distinguishable differences have been found. To partially overcome the problems of preferred orientation and make the relative intensities of the reflections more representative of a powder x-ray pattern, the sample plate was rotated on 30° from the initial position normal to x-ray beam with a step of 1° in w-axis during data collection. Positions of the lines obtained as the average over all collected spectra. The position of the finely collimated x-ray beam penetrating through the silica grain was continuously monitored on a screen with a CCD camera. We made efforts to include smooth areas as shown in Fig. 1B within the four areas irradiated by the x-ray beam.
-
-
-
-
28
-
-
0040631166
-
-
A. El Goresy, T. G. Sharp, M. Chen, B. Wopenka, Lunar Planet. Sci. Conf. XXIX, 1707 (1998)
-
(1998)
Lunar Planet. Sci. Conf.
, vol.29
, pp. 1707
-
-
El Goresy, A.1
Sharp, T.G.2
Chen, M.3
Wopenka, B.4
-
29
-
-
0033612022
-
-
T. C. Sharp, A. El Goresy, B. Wopenka, M. Chen, Science, 284, 1511 (1999).
-
(1999)
Science
, vol.284
, pp. 1511
-
-
Sharp, T.C.1
El Goresy, A.2
Wopenka, B.3
Chen, M.4
-
30
-
-
0343410098
-
-
note
-
2, we milled the ions with a liquid-nitrogen cooled sample holder and with a 4-kV accelerating potential The sample was lightly coated with amorphous carbon to prevent charging in the electron beam. Samples were investigated with a Philips CM200-FEC (FEI Co., Eindhoven, Netherlands), a 200 kV microscope equipped with a field emission gun (FEG). To minimize irradiation damage during characterization, we collected data on a slow-scan CCD camera while using low electron doses.
-
-
-
-
31
-
-
0000050443
-
-
B. B. Karki, M. C. Warren, G. J. Ackland, J. Crain, Phys. Rev. B 55, 3465 (1997).
-
(1997)
Phys. Rev. B
, vol.55
, pp. 3465
-
-
Karki, B.B.1
Warren, M.C.2
Ackland, G.J.3
Crain, J.4
-
34
-
-
0343410097
-
-
note
-
M.C. is supported by National Science Foundation of China (grant 49825132) and a Deutsche Forschungsgemeinschaft (grant Go 315/15-1). Two anonymous reviewers helped in substantially improving the manuscript.
-
-
-
|