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Industrial Applications of X-Ray Diffraction
Volumn , Issue , 1999, Pages 1-993
Industrial applications of x-ray diffraction
(2)
Chung, Frank H
a
Smith, Deane K
b
a
Sherwin Williams Company Chicago
(
United States
)
b
PENNSYLVANIA STATE UNIVERSITY
(
United States
)
Author keywords
[No Author keywords available]
Indexed keywords
EID
:
85056036132
PISSN
:
None
EISSN
:
None
Source Type
:
Book
DOI
:
None
Document Type
:
Book
Times cited : (
85
)
References (
0
)
Reference 정보가 존재하지 않습니다.
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