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Volumn 58, Issue 1, 2000, Pages 54-61
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Development of an expert system rulebase for the prospective identification of photoallergens
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Author keywords
DEREK; Identification; Partition parameters; Photoallergens
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Indexed keywords
CONTACT ALLERGEN;
ARTICLE;
CHEMICAL ANALYSIS;
CHEMICAL STRUCTURE;
COMPUTER SYSTEM;
CONTROLLED STUDY;
DATA BASE;
GERMANY;
GUINEA PIG;
HEALTH CARE ORGANIZATION;
INFORMATION PROCESSING;
NONHUMAN;
PHOTOALLERGY;
PRACTICE GUIDELINE;
PRIORITY JOURNAL;
QUALITY CONTROL;
SKIN SENSITIVITY;
SKIN SENSITIZATION;
STRUCTURE ANALYSIS;
TOXICITY TESTING;
VALIDATION PROCESS;
ALLERGENS;
ANIMALS;
COUMARINS;
EXPERT SYSTEMS;
GUINEA PIGS;
KETONES;
MOLECULAR STRUCTURE;
STRUCTURE-ACTIVITY RELATIONSHIP;
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EID: 0034529708
PISSN: 10111344
EISSN: None
Source Type: Journal
DOI: 10.1016/S1011-1344(00)00100-7 Document Type: Article |
Times cited : (30)
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References (42)
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