Structural and electrical properties of Sr1-xBaxBi2Ta2O9 thin films

Thin Solid Films

Volumn 377-378, Issue , 2000, Pages 733-738

  Melgarejo, R ^a   Tomar, M S ^a   Dobal, P S ^b   Katiyar, R S ^b  

^a UNIVERSITY OF PUERTO RICO   (Puerto Rico)

^b UNIVERSITY OF PUERTO RICO   (Puerto Rico)

Author keywords

[No Author keywords available]

Indexed keywords

FERROELECTRIC MATERIALS; PEROVSKITE; QUARTZ; RAMAN SPECTROSCOPY; STAINLESS STEEL; STRONTIUM COMPOUNDS; SYNTHESIS (CHEMICAL); THIN FILMS; X RAY DIFFRACTION;

NIOBATES; STRONTIUM BARIUM BISMUTH TANTALUM OXIDE; TANTALATES; TITANATES;

DIELECTRIC FILMS;

EID: 0034507219     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0040-6090(00)01324-9     Document Type: Article

References (18)

1. Zheludev I.S. Physics of Crystalline Dielectrics. 1971;Plenum, New York.
2. Damjanovic D. Rep. Prog. Phys. 61:1998;1267.
3. 3 thin films. J. Integr. Ferroelectr. 29:2000;143.
4. Paz de Araujo C.A., Cuchiaro J.D., McMillan L.D., Scott M.C., Scott J.F. Nature. 374:1995;627.
5. Amanuma K., Hase T., Miyasaka Y. Appl. Phys. Lett. 66:1995;221.
6. Boyle T.J., Buchheit C.D., Rodriguez M.A., Al-Shareef H.N., Hernandez B.A., Scott B., Ziller J.W. J. Mater. Res. 11:1996;2274.
7. Desu S.B., Joshi P.C., Zhang X., Ryu S.O. Appl. Phys. Lett. 71:1997;1041.
8. Lee J.S., Kim H.H., Kwon H.J., Jeong Y.W. Appl. Phys. Lett. 73:1998;166.
9. Foschini C.R., Joshi P.C., Varela J.A., Desu S.B. J. Mater. Res. 14:1999;1860.
10. Zhang X.Y., Huang Z.Z., Chan H.L.W., Kwok K.W., Choy C.L. J. Eur. Ceram. Soc. 19:1999;985.
11. Melgarejo R., Tomar M.S., Dobal P., Katiyar R.S. J. Mater. Res. 15:2000;1661.
12. Ross Macdonald J. Impedance Spectroscopy. 1987;Wiley.
13. Irvine J.T.S., Sinclair D.C., West A.R. Adv. Mater. 2:1992;132.
14. Graves P.R., Hua G., Myhra S., Thompson J.G. J. Solid-State Chem. 144:1995;112.
15. Moret M.P., Zallen R., Newnham R.E., Joshi P.C., Desu S.B. Phys. Rev. B57:1998;5715.
16. Kojima S., Saitoh I., Yamamoto T. Proceedings of the 11th IEEE International Symposium on Applications of Ferroelectrics, Montreux, Switzerland. 1998;471. IEEE catalog No. 98CH36245.
17. Perez W., Ching-Prado E., Dobal P.S., Reynes-Figeroa A., Katiyar R.S, Trumala S., Desu S.B. Proc. Mater. Res. Soc. 541:1998;247.
18. Srinivas S., Das R.R., Fachini E.R., Mercado J., Perez W., Katiyar R.S. Proc. Mater. Res. Soc. 596:1999;0000.