Electrochemically modulated diffraction. A novel strategy for the determination of conduction-band-edge energies for nanocrystalline thin-film semiconductor electrodes

Electrochemical and Solid-State Letters

Volumn 3, Issue 12, 2000, Pages 555-558

  Dang, Xiaojun ^a   Massari, Aaron M ^a   Hupp, Joseph T ^a  

^a NORTHWESTERN UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

DIFFRACTION; ELECTROCHEMISTRY; ELECTROLYTES; LIGHT ABSORPTION; NANOSTRUCTURED MATERIALS; REFRACTIVE INDEX; SEMICONDUCTOR DEVICES; THIN FILM DEVICES; TITANIUM DIOXIDE;

ELECTROCHEMICALLY MODULATED DIFFRACTION; THIN FILM SEMICONDUCTOR ELECTRODES;

ELECTROCHEMICAL ELECTRODES;

EID: 0034506013     PISSN: 10990062     EISSN: None     Source Type: Journal    
DOI: 10.1149/1.1391207     Document Type: Article

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