SCOPUS 정보 검색 플랫폼

Thin Solid Films

Volumn 379, Issue 1-2, 2000, Pages 133-138

TEM annealing study of normal grain growth in silver thin films

(4) Dannenberg, Rand a Stach, Eric b Groza, Joanna R c Dresser, Brian J c

a BOC Coating Technology (United States)

b LAWRENCE BERKELEY NATIONAL LABORATORY (United States)

c UNIVERSITY OF CALIFORNIA (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ACTIVATION ENERGY; ANNEALING; COMPUTATIONAL METHODS; CURVE FITTING; GRAIN GROWTH; MASS TRANSFER; SILVER; THIN FILMS; TRANSMISSION ELECTRON MICROSCOPY;

AS-DEPOSITED FILMS; FITTING FUNCTIONS;

METALLIC FILMS;

EID: 0034504725 PISSN: 00406090 EISSN: None Source Type: Journal
DOI: 10.1016/S0040-6090(00)01570-4 Document Type: Article

Times cited : (85)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.