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Volumn 340, Issue 2-3, 2000, Pages 93-100
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Double-barrier junction based dc SQUID
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Author keywords
[No Author keywords available]
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Indexed keywords
ALUMINA;
ALUMINUM;
CRITICAL CURRENT DENSITY (SUPERCONDUCTIVITY);
CURRENT VOLTAGE CHARACTERISTICS;
ELECTRIC CURRENTS;
NIOBIUM;
SEMICONDUCTOR JUNCTIONS;
THERMAL EFFECTS;
DOUBLE-BARRIER JUNCTIONS;
SQUIDS;
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EID: 0034501539
PISSN: 09214534
EISSN: None
Source Type: Journal
DOI: 10.1016/S0921-4534(00)00837-6 Document Type: Article |
Times cited : (7)
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References (13)
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