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Volumn 340, Issue 2-3, 2000, Pages 93-100

Double-barrier junction based dc SQUID

Author keywords

[No Author keywords available]

Indexed keywords

ALUMINA; ALUMINUM; CRITICAL CURRENT DENSITY (SUPERCONDUCTIVITY); CURRENT VOLTAGE CHARACTERISTICS; ELECTRIC CURRENTS; NIOBIUM; SEMICONDUCTOR JUNCTIONS; THERMAL EFFECTS;

EID: 0034501539     PISSN: 09214534     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0921-4534(00)00837-6     Document Type: Article
Times cited : (7)

References (13)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.