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Volumn 12, Issue 49, 2000, Pages 10065-10069

Activities of dislocations in heavily impurity-doped Si

Author keywords

[No Author keywords available]

Indexed keywords

CRYSTAL GROWTH FROM MELT; CRYSTAL IMPURITIES; DISLOCATIONS (CRYSTALS); SEGREGATION (METALLOGRAPHY); SEMICONDUCTING BORON; SILICON WAFERS; STRESS ANALYSIS; THERMAL EFFECTS;

EID: 0034499439     PISSN: 09538984     EISSN: None     Source Type: Journal    
DOI: 10.1088/0953-8984/12/49/306     Document Type: Article
Times cited : (11)

References (11)
  • 4
    • 0000926419 scopus 로고
    • Sirtl E and Adler A 1961 Z. Metallk. 52 529 Sirtl E and Adler A 1985 ASTM Standard F80-85 (Philadelphia, PA: ASTM)
    • (1961) Z. Metallk. , vol.52 , pp. 529
    • Sirtl, E.1    Adler, A.2
  • 5
    • 0004229184 scopus 로고
    • Philadelphia, PA: ASTM
    • Sirtl E and Adler A 1961 Z. Metallk. 52 529 Sirtl E and Adler A 1985 ASTM Standard F80-85 (Philadelphia, PA: ASTM)
    • (1985) ASTM Standard
    • Sirtl, E.1    Adler, A.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.