|
Volumn 12, Issue 49, 2000, Pages 10065-10069
|
Activities of dislocations in heavily impurity-doped Si
a |
Author keywords
[No Author keywords available]
|
Indexed keywords
CRYSTAL GROWTH FROM MELT;
CRYSTAL IMPURITIES;
DISLOCATIONS (CRYSTALS);
SEGREGATION (METALLOGRAPHY);
SEMICONDUCTING BORON;
SILICON WAFERS;
STRESS ANALYSIS;
THERMAL EFFECTS;
DISLOCATION GENERATION;
SEMICONDUCTOR DOPING;
|
EID: 0034499439
PISSN: 09538984
EISSN: None
Source Type: Journal
DOI: 10.1088/0953-8984/12/49/306 Document Type: Article |
Times cited : (11)
|
References (11)
|