High speed IDDQ test and its testability for process variation

Proceedings of the Asian Test Symposium

Volumn , Issue , 2000, Pages 344-349

  Hashizume, Masaki ^a   Yotsuyanagi, Hiroyuki ^a   Ichimiya, Masahiro ^a   Tamesada, Takeomi ^a   Takeda, Masashi ^a  

^a UNIVERSITY OF TOKUSHIMA   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

CHARGE CURRENTS;

CAPACITANCE; CMOS INTEGRATED CIRCUITS; ELECTRIC CURRENTS; GATES (TRANSISTOR);

INTEGRATED CIRCUIT TESTING;

EID: 0034497760     PISSN: 10817735     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (17)

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