TI-BIST: A temperature independent analog BIST for switched-capacitor filters

Proceedings of the Asian Test Symposium

Volumn , Issue , 2000, Pages 78-83

  Carro, L ^a   Cota, E ^a   Lubaszewski, M ^a   Bertrand, Y ^b   Azais, F ^b   Renovell, M ^b  

^a FEDERAL UNIVERSITY OF RIO GRANDE DO SUL   (Brazil)

^b LIRMM   (France)

Author keywords

[No Author keywords available]

Indexed keywords

SWITCHED CAPACITOR FILTERS;

BUILT-IN SELF TEST; CAPACITORS; COMPUTER SIMULATION; FUNCTION GENERATORS; SWITCHED FILTERS; THERMAL EFFECTS;

INTEGRATED CIRCUIT TESTING;

EID: 0034497143     PISSN: 10817735     EISSN: None     Source Type: Journal    
DOI: 10.1109/ATS.2000.893606     Document Type: Article

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