SCOPUS 정보 검색 플랫폼

Volumn 33, Issue 3 I, 2000, Pages 690-694

Comparison of intensity profile analysis and correlation function methods for studying the lamellar structures of semicrystalline polymers using small-angle x-ray scattering

(3) Wang, Z G a Hsiao, B S a Sanjeeva Murthy, N a

a STONY BROOK UNIVERSITY (United States)

Author keywords

[No Author keywords available]

Indexed keywords

NYLON; POLYMER;

CONFERENCE PAPER; COOLING; CRYSTAL STRUCTURE; HEATING; INTERMETHOD COMPARISON; SYNCHROTRON; X RAY CRYSTALLOGRAPHY;

EID: 0034496668 PISSN: 00218898 EISSN: None Source Type: Journal
DOI: 10.1107/S0021889899014193 Document Type: Conference Paper

Times cited : (37)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.