Study of the influence of oxygen on structural perfection of silicon single crystals by high-resolution X-ray diffraction and infrared absorption measurements

Journal of Applied Crystallography

Volumn 33, Issue 1, 2000, Pages 2-9

  Lal, Krishan ^a   Ramanan, R R ^a   Bhagavannarayana, G ^a  

^a NATIONAL PHYSICAL LABORATORY   (India)

Author keywords

[No Author keywords available]

Indexed keywords

OXYGEN; SILICON;

ABSORPTION; ARTICLE; ATOM; CLUSTER ANALYSIS; CRYSTAL; CRYSTAL STRUCTURE; CRYSTALLIZATION; DETERIORATION; GEOMETRY; INFRARED RADIATION; INTERMETHOD COMPARISON; MEASUREMENT; PURIFICATION; RADIATION SCATTERING; TEMPERATURE DEPENDENCE; X RAY DIFFRACTION;

EID: 0034480411     PISSN: 00218898     EISSN: None     Source Type: Journal    
DOI: 10.1107/S0021889899010328     Document Type: Article

References (17)

1. ASTM (1980). Annual Book of The American Society for Testing Materials Standards, F121-80, 538-540.
2. Batterman, B. W. & Cole, H. (1964). Rev. Mod. Phys. 36, 681-717.
3. Bergholtz, W., Binns, M. J., Booker, G. R., Hutchison, J. C., Kinder, S. H., Messoloras, S., Newman, R. C., Stewart, R. J. & Wilkes, R. J. (1989). Phil. Mag. B, 59, 499-522.
4. Bonse, U. & Hart, M. (1965). Appl. Phys. Lett. 7, 238-240.
5. Borghesi, A., Pivac, B., Sassella, A. & Stella, A. (1995). J. Appl. Phys. 77, 4171-4244.
6. Ciszek, T. F. (1991). Solar Cells, 30, 5-13.
7. Claeys, C. & Vanhellomont, J. (1993). J. Cryst. Growth, 126, 41-62.
8. Davies, G. (1984). Diamond. London: Adam Hilger.
9. Dederichs, P. H. (1973). J. Phys. F, 3, 471-496.
10. Fuji, S., Nishibayashi, Y., Shikata, S., Uedono, A. & Tanigawa, S. (1995). J. Appl. Phys. 78, 1510-1513.
11. Gupta, D., Awasthy, B. & Varma, S. P. (1993). J. Mater. Sci. 28, 1488-1490.
12. Huang, K. (1947). Proc. R. Soc. London Ser. A, 190, 102-117.
13. Huff, H. R. & Goodall, R. K. (1996). Solid State Phenom. 47-48, 65-96.
14. Huff, H. R. & Shimura, F. (1985). Solid State Technol 28, 103-118.
15. James, R. W. (1950). The Optical Principles of Diffraction of X-rays. London: Bell.
16. Kishino, S., Matsushita, Y. & Kanamori, M. (1979). Appl. Phys. Lett. 35, 213-215.
17. Lal, K. (1993). Bull. Mater. Sci. 16, 617-642.