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Volumn 2, Issue , 2000, Pages 695-698

A dynamic ferroelectric capacitance model for circuit simulators

Author keywords

[No Author keywords available]

Indexed keywords

CAPACITANCE; CAPACITORS; COMPUTER SIMULATION; ELECTRIC POTENTIAL; ELECTRON DEVICE TESTING; HYSTERESIS; MATHEMATICAL MODELS; PARAMETER ESTIMATION; RANDOM ACCESS STORAGE;

EID: 0034474416     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper
Times cited : (8)

References (11)
  • 6
    • 0032259574 scopus 로고    scopus 로고
    • Temperature dependence of the polarization reversal in lead-zirconate-titanate thin film capacitors
    • ISAF 1998 , pp. 27-30
    • Lohse, O.1
  • 9
    • 84886448173 scopus 로고    scopus 로고
    • 9 thin film capacitor model including polarization reversal response for nanosecond range circuit simulation of ferroelectric nonvolatile memory
    • IEDM 1997 , pp. 621-624
    • Takeo, M.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.