Some aspects of pseudo random binary array-based surface characterization

IEEE Transactions on Instrumentation and Measurement

Volumn 49, Issue 6, 2000, Pages 1331-1336

  Spoelder, H J W ^a   Vos, F M ^a   Petriu, Emil M ^b,c   Groen, F C A ^d  

^a VU UNIVERSITY AMSTERDAM   (Netherlands)

^b UNIVERSITY OF OTTAWA   (Canada)

^c IEEE

^d UNIVERSITY OF AMSTERDAM   (Netherlands)

Author keywords

[No Author keywords available]

Indexed keywords

ALGORITHMS; BINARY SEQUENCES; COLOR; COMPUTATIONAL GEOMETRY; IMAGE CODING; MEDICAL IMAGING; OPTICAL VARIABLES MEASUREMENT; SPECTRUM ANALYSIS; TWO DIMENSIONAL;

BIOMEDICAL SIGNAL ANALYSIS; PSEUDO NOISE PROCESSES; PSEUDO RANDOM BINARY ARRAYS;

COLOR IMAGE PROCESSING;

EID: 0034468172     PISSN: 00189456     EISSN: None     Source Type: Journal    
DOI: 10.1109/19.893279     Document Type: Article

References (9)

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