A study of the robustness of Pseudo random binary array based surface characterization

Conference Record - IEEE Instrumentation and Measurement Technology Conference

Volumn 2, Issue , 1997, Pages 830-835

  Spoelder, H J W ^a   Vos, F M ^a   Petriu, E M ^b   Groen, F C A ^c  

^a VU UNIVERSITY AMSTERDAM   (Netherlands)

^b UNIVERSITY OF OTTAWA   (Canada)

^c UNIVERSITY OF AMSTERDAM   (Netherlands)

Author keywords

[No Author keywords available]

Indexed keywords

PATTERN RECOGNITION; COMPUTER SIMULATION; IMAGE RECONSTRUCTION; THREE DIMENSIONAL COMPUTER GRAPHICS; VECTORS;

ADDED VALUES; BINARY ARRAYS; PSEUDO RANDOM; SURFACE CHARACTERIZATION; THREE-DIMENSIONAL SCENES;

IMAGE PROCESSING; IMAGING SYSTEMS;

PSEUDO RANDOM BINARY ARRAYS (PRBA);

EID: 0030643954     PISSN: 10915281     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/IMTC.1997.610192     Document Type: Conference Paper

References (8)

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