Atomic force microscopy study of adsorbed moisture on lactose particles

Advanced Powder Technology

Volumn 11, Issue 4, 2000, Pages 401-413

  Dey, F K ^a   Cleaver, J A S ^a   Zhdan, P A ^a  

^a UNIVERSITY OF SURREY   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

ADSORPTION; ATOMIC FORCE MICROSCOPY; MOISTURE DETERMINATION; SURFACE PHENOMENA; SURFACE ROUGHNESS; THICK FILMS; THICKNESS MEASUREMENT; VAN DER WAALS FORCES;

LACTOSE PARTICLES;

POWDERS;

EID: 0034455398     PISSN: 09218831     EISSN: None     Source Type: Journal    
DOI: 10.1163/156855200750172024     Document Type: Article

References (13)

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