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Volumn 609, Issue , 2000, Pages

A laplace transform technique for direct determination of density of electronic states in disordered semiconductors from transient photocurrent data

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER SIMULATION; ELECTRONIC DENSITY OF STATES; LAPLACE TRANSFORMS; LINEAR ALGEBRA; LINEAR EQUATIONS; PHOTOCURRENTS;

EID: 0034431075     PISSN: 02729172     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1557/proc-609-a27.8     Document Type: Conference Paper
Times cited : (3)

References (8)
  • 3
    • 0031381020 scopus 로고    scopus 로고
    • Amorphous and Microcrystalline Silicon Technology, edited by M. Hack, E.A. Schiff, S. Wagner, A. Matsuda and R. Schropp (Pittsburgh, PA)
    • (1997) Mater. Res. Soc. Proc. , vol.467 , pp. 167-178
    • Main, C.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.