SCOPUS 정보 검색 플랫폼

Materials Research Society Symposium - Proceedings

Volumn 612, Issue , 2000, Pages

The effect of fatigue on the adhesion and subcritical debonding of benzocyclobutene/silicon dioxide interfaces

(2) Snodgrass, J M a Dauskardt, R H a

a Stanford University (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ADHESION; CYCLIC LOADS; FATIGUE TESTING; FRACTURE MECHANICS; INTERFACES (MATERIALS); SILICA; STRAIN MEASUREMENT; STRESS ANALYSIS; SURFACE CHEMISTRY; THERMAL EFFECTS; THIN FILMS;

DEBONDING; STRAIN ENERGY;

DIELECTRIC MATERIALS;

EID: 0034429757 PISSN: 02729172 EISSN: None Source Type: Conference Proceeding
DOI: 10.1557/proc-612-d1.3.1 Document Type: Conference Paper

Times cited : (2)

References (10)

1
- 0003532729
- in publication
- J. Mater. Res.
- Lane, M.W.¹ Dauskardt, R.H.² Krishna, N.³ Hashim, I.⁴

2
- 0032148208
- (1998) Eng. Fract. Mech. , vol.61 , pp. 141
- Dauskardt, R.H.¹ Lane, M.² Ma, Q.³ Krishna, N.⁴

3
- 0029502626
- Materials Reliability in Microelectronics V, Warrendale, PA
- (1995) Mater. Res. Soc. Proc. , vol.391 , pp. 91-96
- Ma, Q.¹ Fujimoto, H.² Flynn, P.³ Jain, V.⁴ Adibi-Rizi, F.⁵ Dauskardt, R.H.⁶

4
- 0033300079
- Low-k Materials and Applications in Microelectronics, Warrendale, PA
- (1999) Mater. Res. Soc. Proc. , vol.565
- Snodgrass, J.M.¹ Pantelidis, D.² Bravman, J.C.³ Dauskardt, R.H.⁴

5
- 0030692908
- (1997) J. Adhesion , vol.63 , pp. 265
- Ritter, J.E.¹ Lardner, T.J.² Grayeski, W.³ Prakash, G.C.⁴ Lawrence, J.⁵

6
- 0015589054
- (1973) Int. J. Fract. , vol.9 , pp. 83
- Kanninen, M.F.¹

7
- 0031384881
- Materials Reliability in Microelectronics VII, Warrendale, PA
- (1997) Mater. Res. Soc. Proc. , vol.473 , pp. 3-14
- Ma, Q.¹ Bumgarner, J.² Fujimoto, H.³ Lane, M.W.⁴ Dauskardt, R.H.⁵

8
- 0004051772
- ASTM Standard E647-95 (American Society for Testing Materials for Testing and Materials, Philadelphia)
- (1995) 1995 ASTM Annual Book of Standards , vol.3

9
- 0015662016
- (1973) Int. J. Fract. , vol.9 , pp. 267
- Evans, A.G.¹

10
- 0000395026
- (1992) J. of Appl. Mech. , vol.59 , pp. 295
- Lechti, K.M.¹ Chai, Y.-S.²

* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.